发明名称 |
Field effect transistor and method for manufacturing same |
摘要 |
A field effect transistor comprises a SiC substrate 1, a source 3a and a drain 3b formed on the surface of the SiC substrate 1, an insulating structure comprising an AlN layer 5 formed in contact with the SiC surface and having a thickness of one molecule-layer or greater, and a SiO2 layer formed thereon, and a gate electrode 15 formed on the insulation structure. Leakage current can be controlled while the state of interface with SiC is maintained in a good condition.
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申请公布号 |
US7622763(B2) |
申请公布日期 |
2009.11.24 |
申请号 |
US20040565624 |
申请日期 |
2004.07.28 |
申请人 |
JAPAN SCIENCE AND TECHNOLOGY AGENCY |
发明人 |
SUDA JUN;MATSUNAMI HIROYUKI |
分类号 |
H01L29/792;H01L21/04;H01L21/28;H01L29/24;H01L29/51;H01L29/78 |
主分类号 |
H01L29/792 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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