发明名称 Field effect transistor and method for manufacturing same
摘要 A field effect transistor comprises a SiC substrate 1, a source 3a and a drain 3b formed on the surface of the SiC substrate 1, an insulating structure comprising an AlN layer 5 formed in contact with the SiC surface and having a thickness of one molecule-layer or greater, and a SiO2 layer formed thereon, and a gate electrode 15 formed on the insulation structure. Leakage current can be controlled while the state of interface with SiC is maintained in a good condition.
申请公布号 US7622763(B2) 申请公布日期 2009.11.24
申请号 US20040565624 申请日期 2004.07.28
申请人 JAPAN SCIENCE AND TECHNOLOGY AGENCY 发明人 SUDA JUN;MATSUNAMI HIROYUKI
分类号 H01L29/792;H01L21/04;H01L21/28;H01L29/24;H01L29/51;H01L29/78 主分类号 H01L29/792
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