发明名称 Method of forming an electrically conductive line in an integrated circuit
摘要 A method of forming a semiconductor structure comprises providing a semiconductor structure comprising a layer of a dielectric material provided over an electrically conductive feature. An opening is formed in the layer of dielectric material. The opening is located over the electrically conductive feature and has a first lateral dimension. A cavity is formed in the electrically conductive feature. The cavity has a second lateral dimension being greater than the first lateral dimension. The cavity and the opening are filled with an electrically conductive material.
申请公布号 US7622391(B2) 申请公布日期 2009.11.24
申请号 US20070678324 申请日期 2007.02.23
申请人 ADVANCED MICRO DEVICES, INC. 发明人 FROHBERG KAI;WERNER THOMAS;QING SU RUO
分类号 H01L21/311 主分类号 H01L21/311
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