| 摘要 |
PURPOSE: A probe pin and a test socket using the same are provided to maintain the transmission path of an electric signal in the same impedance and transmit the electric signal, thereby improving the reliability. CONSTITUTION: A test socket includes an upper contact part, an upper fixing part, a body, a probe pin lower part, and a lower contact part. The upper contact part(101) is contacted with a lead of a semiconductor package to bi-directionally transmit a signal. The upper fixing part is fixed to a housing or a mold material. According as the body is connected with a pin upper part fixing unit and the upper contact part is pressed, two points are deformed. Therefore, an upper bending part(103) and a lower bending part(104) are contacted with an upper deformation part(107) and a lower deformation part(108). The probe pin lower part is connected to the probe pin body to support the elasticity generated from the body. A lower contact part(106) functions as a path through which an electric signal is transmitted to the outside by being connected with a probe pin lower part.
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