发明名称 |
Method and apparatus for measuring device mismatches |
摘要 |
A test structure for statistical characterization of local device mismatches contains densely populated SRAM devices arranged in a row/column addressable array that enables resource sharing of many devices. The test structure includes a built-in sensing mechanism to calibrate or null out sources of error, and current steering to avoid negative effects of current leakage along spurious paths. The gate and drain lines of each column are driven from both the top and bottom to minimizes parasitic effects. The system can handle a large number of devices while still providing high spatial resolution of current measurements.
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申请公布号 |
US7622942(B2) |
申请公布日期 |
2009.11.24 |
申请号 |
US20080147024 |
申请日期 |
2008.06.26 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
AGARWAL KANAK B.;LIU YING;MCDOWELL CHANDLER T.;NASSIF SANI R.;PLUSQUELLIC JAMES F.;SIVAGNANAME JAYAKUMARAN |
分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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