发明名称 Calibration of tester and testboard by golden sample
摘要 In performing testing on Automatic Test Equipment (ATE) it is a challenge to accurately generate and measure RF (radio frequency) power. In an example embodiment, in a test apparatus used for measuring the input and output characteristics of an amplifier, there is a method for determining test program parameters. The method involves calculating input loss from the test apparatus power source to the input of the amplifier, defining an input loss correction factor. The output loss from the amplifier output to the power meter of the test apparatus is calculated, defining an output loss correction factor. Using the input loss correction factor, a real input power level is determined and using the output loss correction factor, a real output level is determined.
申请公布号 US7623979(B2) 申请公布日期 2009.11.24
申请号 US20060567172 申请日期 2006.02.03
申请人 NXP B.V. 发明人 VISSER HENDRIK;SPAIN SHERRY
分类号 G01D18/00;G01D21/00;G01P21/00;G01R31/28;G01R35/00 主分类号 G01D18/00
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