发明名称 Floating gate non-volatile memory and method thereof
摘要 A method is provided which includes forming a first gate overlying a major surface of an electronic device substrate and forming a second gate overlying and spaced apart from the first gate. The method further includes forming a charge storage structure horizontally adjacent to, and continuous along, the first gate and the second gate, wherein a major surface of the charge storage structure is substantially vertical to the major surface of the substrate.
申请公布号 US7622349(B2) 申请公布日期 2009.11.24
申请号 US20050302937 申请日期 2005.12.14
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 SADD MICHAEL A.;CHINDALORE GOWRISHANKAR L.;HONG CHEONG M.
分类号 H01L21/8239;H01L21/28 主分类号 H01L21/8239
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