发明名称 |
Method and apparatus for testing an IC device based on relative timing of test signals |
摘要 |
An apparatus for testing an IC device includes a test signal generator for generating a predefined sequence of test signals that are input to the IC device. A timing skew monitor is provided for monitoring the test signals input in the IC device and a signal output from the IC device for a predetermined time period, and creating an array indicating an execution or a nonexecution of signal timing combinations of one of the test signals relative to at least one of the other test signals within the predetermined time period by the IC device. A determination as to whether the desired signal timing combinations of the test signals have been executed by the IC device is made by an operator.
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申请公布号 |
US7624323(B2) |
申请公布日期 |
2009.11.24 |
申请号 |
US20060590047 |
申请日期 |
2006.10.31 |
申请人 |
HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. |
发明人 |
CASILLAS, JR. SERGIO;LAVIGNE BRUCE |
分类号 |
G06F11/00;G01D18/00;G01D21/00;G01M99/00;G01P21/00;G01R35/00;G04F1/00;G04F3/00;G04F5/00;G04F7/00;G04F8/00;G04F10/00;G04G5/00;G04G7/00;G04G15/00;G06F9/45;G06F17/50;G06K5/04;G11B5/00;G11B20/20;H03M13/00 |
主分类号 |
G06F11/00 |
代理机构 |
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代理人 |
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地址 |
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