发明名称 Method for providing an endpoint layer for ion milling of top of read sensor having top lead connection and sensor formed thereby
摘要 A method for providing an endpoint layer for ion milling of top of read sensor having top lead connection and sensor formed thereby. A cap layer includes a thin layer of an endpoint detection material, such as a conductive or insulating material, that is inserted in the cap layer. The endpoint detection material provides a good signal for endpoint detection during ion milling of the of the cap layer.
申请公布号 US7623325(B2) 申请公布日期 2009.11.24
申请号 US20050239514 申请日期 2005.09.29
申请人 HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V. 发明人 JAYASEKARA WIPUL PEMSIRI
分类号 G11B5/127 主分类号 G11B5/127
代理机构 代理人
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