发明名称 |
METHOD FOR POLISHING HETEROSTRUCTURES |
摘要 |
A polishing method of a heterostructure (12) comprising at least one relaxed superficial heteroepitaxial layer (121) on a substrate (120) made from a different material from that of said heteroepitaxial layer. The method comprises a first chemical mechanical polishing step of the surface of the heteroepitaxial layer (12) performed with a polishing cloth (14) having a first compressibility ratio and with a polishing solution having a first silica particle concentration. The first chemical mechanical polishing step is followed by a second chemical mechanical polishing step of the surface of the heteroepitaxial layer (121), said second step being performed with a polishing cloth having a second compressibility ratio, higher than said first compressibility ratio, and with a polishing solution having a second silica particle concentration, lower than said first concentration.
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申请公布号 |
KR20090119834(A) |
申请公布日期 |
2009.11.20 |
申请号 |
KR20097014793 |
申请日期 |
2008.01.23 |
申请人 |
S.O.I TEC SILICON ON INSULATOR TECHNOLOGIES |
发明人 |
MARTINEZ MURIEL;SEGUIN CORINNE;LOGIOU MORGANE |
分类号 |
H01L21/304;H01L21/20;H01L21/302 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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