| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a testing device for performing various function tests in a comparatively simple configuration. Ž<P>SOLUTION: The testing device includes an input terminal IN, an output terminal OUT, and a control terminal CTRL, and tests a semiconductor device 1 including operation in which the output terminal is in a high impedance state based on a control signal applied on the control terminal CTRL. The testing device includes a test signal supply circuit 20, a comparison circuit 30 for comparing an output signal output from the output terminal with a reference voltage, a reference voltage setting part 40 for setting the reference voltage at a voltage of a high level side or a low level side, and a load voltage supply circuit 50 for supplying a load voltage to the output signal when the control signal is applied. The load voltage supply circuit 50 supplies a higher load voltage than the voltage of the high level side to the output signal when the reference voltage is set at the high level side, and supplies a lower load voltage than the voltage of the low level side to the output signal when the reference voltage is set at the low level side. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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