| 摘要 |
PROBLEM TO BE SOLVED: To provide a system for compensating the degradation of a test signal. SOLUTION: A device is provided for simultaneously supplying a test signal to a plurality of IC terminals of an IC circuit during testing the integrated circuit (IC). An electronic device tester channel supplies a single test signal to a plurality of terminals of electronic devices of under test (DUTs) through a set of isolation resisters. The tester channel employs feedback to automatically adjust the test signal voltage to compensate for affects of faults at any of the DUT terminals to prevent the faults from substantially affecting the test signal voltage. COPYRIGHT: (C)2010,JPO&INPIT |
