发明名称 METHOD FOR FABRICATING A SEMICONDUCTOR CAPACITPR DEVICE
摘要 A method for fabricating a semiconductor capacitor includes a substrate having thereon a carbon electrode. A transitional barrier layer is then deposited on the carbon electrode layer. Thereafter, a metal oxide layer is deposited on the transitional barrier layer, which reacts with the underlying transitional barrier layer to form a metal oxy-nitride layer acting as a capacitor dielectric layer of the capacitor device. A top electrode layer is then formed on the metal oxy-nitride layer.
申请公布号 US2009283856(A1) 申请公布日期 2009.11.19
申请号 US20080167239 申请日期 2008.07.02
申请人 HUANG TSAI-YU;NIEH SHIN-YU;HSIEH CHUN-I 发明人 HUANG TSAI-YU;NIEH SHIN-YU;HSIEH CHUN-I
分类号 H01L29/94 主分类号 H01L29/94
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