发明名称 PATTERNING PROCESS
摘要 PURPOSE: A patterning method is provided to use a material in which the melting is difficult as an inversion layer and to form micro space patterns and hole patterns with broad bridge margin. CONSTITUTION: A patterning method using positive negative inversion comprises the steps of: forming a resist layer(30) by at least a positive type resist composition on a substrate(10); obtaining a positive type pattern(30a) by exposing and developing the resist film; crosslinking the obtained positive type pattern; forming an inversion layer(40); and inverting a negative type pattern by dissolving and removing the inversion layer with an alkaline wet etching solution.
申请公布号 KR20090119721(A) 申请公布日期 2009.11.19
申请号 KR20090042005 申请日期 2009.05.14
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 HATAKEYAMA JUN;OGIHARA TSUTOMU;NAKASHIMA MUTSUO;KATAYAMA KAZUHIRO
分类号 G03F7/039;G03F7/20 主分类号 G03F7/039
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