| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a flaw inspection apparatus for metal wire-like material and a continuous processing apparatus comprising an inspection means capable of being adopted without limitation on property and type of objective wire material and of inspecting with low cost a wire material moving at high speeds. <P>SOLUTION: The flaw inspection apparatus for metal wire-like material and the continuous processing apparatus using the flaw inspection apparatus are provided, wherein a circuit is formed by being made cordless in a contact or noncontact manner between a light source section 16 which is comprised of a rotating body rotating around wire-like material W as an axis and which irradiates an illuminating light orthogonal to the wire-like material, a rotating substrate 11 which comprises a light receiving sensor 17 arranged at a location where the illuminating light and a reflected light from the wire-like material are received at an angleθof >90 degrees to <180 degrees in view of the cross section of the wire-like material, a supplying source of the illuminating light provided outside the system, and a data analyzing section which analyzes received light data by the light receiving sensor to convert it into a surface flaw, with respect to electric connection with the rotating substrate in an outside system apparatus. <P>COPYRIGHT: (C)2010,JPO&INPIT</p> |
