发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 <p>A semiconductor device includes: an internal transistor and an I/O transistor. The internal transistor includes: a first gate electrode (103a); a first impurities region (106a) containing first impurities; and a first inner side wall spacer (107a) and a first outer side wall spacer (109a) formed on the side surface of the first gate electrode. The I/O transistor includes: a second gate electrode (103b); a second impurities region (106b) containing the second impurities of the same conductive type as the first impurities; and a second inner side wall spacer (107b) and a second outer side wall spacer (109b) formed on the side surface of the second gate electrode (103b). The second inner side wall spacer (107b) contains second impurities at the boundary with the second outer side wall spacer (109b).</p>
申请公布号 WO2009139098(A1) 申请公布日期 2009.11.19
申请号 WO2009JP00698 申请日期 2009.02.19
申请人 PANASONIC CORPORATION;YAMADA, TAKAYUKI 发明人 YAMADA, TAKAYUKI
分类号 H01L21/8234;H01L27/088 主分类号 H01L21/8234
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