发明名称 METHODS AND SYSTEMS FOR INTENSITY MODELING INCLUDING POLARIZATION
摘要 Embodiments of the present invention provide computer readable media encoded with executable instructions for modeling an intensity profile at a surface illuminated by an illumination source through a mask. Further embodiments provide methods for correcting a mask pattern and methods for selecting an illumination source. Still further embodiments provide masks and integrated circuits produced using a model of the illumination source. Embodiments of the present invention take into account the polarization of the illumination source and are able to model the effect of polarization on the resultant intensity profile.
申请公布号 US2009287461(A1) 申请公布日期 2009.11.19
申请号 US20080120052 申请日期 2008.05.13
申请人 MICRON TECHNOLOGY, INC. 发明人 LEE CHUNG-YI;WANG FEI
分类号 G06F17/10 主分类号 G06F17/10
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