发明名称 POLISHING PAD WITH ENDPOINT WINDOW AND SYSTEMS AND METHOD USING THE SAME
摘要 A polishing pad including a path therethrough to transmit a signal for in situ monitoring of an endpoint in a polishing operation. In one embodiment, the polishing pad includes a polishing composition distribution layer on a first side of a guide plate and a support layer on an opposed second side of a guide plate. The guide plate retains a plurality of polishing elements that extend along a first direction substantially normal to a plane including the polishing pad and through the polishing composition distribution layer. The polishing pad includes an optical path along the first direction and through a thickness of the pad.
申请公布号 WO2009140622(A2) 申请公布日期 2009.11.19
申请号 WO2009US44187 申请日期 2009.05.15
申请人 3M INNOVATIVE PROPERTIES COMPANY;SEMIQUEST, INC.;BAJAJ, RAJEEV;FISHER, STEPHEN, M.;JOSEPH, WILLIAM, D. 发明人 BAJAJ, RAJEEV;FISHER, STEPHEN, M.;JOSEPH, WILLIAM, D.
分类号 B24B37/04;B24B49/12;B24D13/14;H01L21/304 主分类号 B24B37/04
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