发明名称 FILM DEFECT INSPECTION DEVICE AND METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide film defect inspection device and method for detecting defect of a film as early as possible during conveyance and preventing the defective film from being distributed. Ž<P>SOLUTION: This film defect inspection device includes a tensile force applying mechanism 13 for applying tensile force in the direction of width of the film 12, a twitching wrinkle detection part 14 for detecting the presence or absence of wrinkle caused by twitching on the film 12, and a determining part 15 for detecting defect of the film. The determining part 15 is positioned on the downstream side in the direction of conveyance of the film 12 more than the twitching wrinkle detection part 14 to detect the defect of the film 12 being detected to have no wrinkle due to twitching by the twitching wrinkle detection part 14 by the determining part 15. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009271002(A) 申请公布日期 2009.11.19
申请号 JP20080123543 申请日期 2008.05.09
申请人 FUJIFILM CORP 发明人 WAKITA TAKESHI;TAKAHASHI HIDEKAZU;KAMEI HIROYUKI
分类号 G01N21/892;G01B11/30 主分类号 G01N21/892
代理机构 代理人
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