发明名称 SUBSTRATE TREATMENT METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a substrate treatment method for forming a silicon nitride film having a small etching rate to an HF-based solution. Ž<P>SOLUTION: Bistertiarybutylaminosilane gas and ammonium gas are supplied into a treatment chamber 201 for storing a heated substrate 200. A silicon nitride film 304 is formed on the substrate by a CVD method. The substrate where the silicon nitride film is formed is heat-treated under an atmosphere of not less than 800°C. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009272356(A) 申请公布日期 2009.11.19
申请号 JP20080119444 申请日期 2008.05.01
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 MIZUNO KANEKAZU
分类号 H01L21/318;C23C16/42;C23C16/56;H01L21/31 主分类号 H01L21/318
代理机构 代理人
主权项
地址