发明名称 |
SUBSTRATE TREATMENT METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a substrate treatment method for forming a silicon nitride film having a small etching rate to an HF-based solution. Ž<P>SOLUTION: Bistertiarybutylaminosilane gas and ammonium gas are supplied into a treatment chamber 201 for storing a heated substrate 200. A silicon nitride film 304 is formed on the substrate by a CVD method. The substrate where the silicon nitride film is formed is heat-treated under an atmosphere of not less than 800°C. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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申请公布号 |
JP2009272356(A) |
申请公布日期 |
2009.11.19 |
申请号 |
JP20080119444 |
申请日期 |
2008.05.01 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
MIZUNO KANEKAZU |
分类号 |
H01L21/318;C23C16/42;C23C16/56;H01L21/31 |
主分类号 |
H01L21/318 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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