发明名称 DEVICE FOR SURFACE PROFILING
摘要 PURPOSE: An object shape measuring device is provided to measure information on a shape of an object by obtaining sufficient reflection light for measuring the shape of the object. CONSTITUTION: An object shape measuring device comprises a test unit(50), an interferometer(1) and a drive unit(55). The test unit accommodates a test material. The interferometer comprises an optical source part(10), a reflecting part(40), a splitter(20), and a sensor(30). The optical source part emits incident light. The reflecting part reflects the light. The splitter distributes the incident light to the test unit and the reflecting part. The splitter causes the interference of the light returned from the test unit and the reflecting part. The sensor senses the interference fringe of the test material. The drive unit rotates or moves on the test unit and the interferometer.
申请公布号 KR20090118573(A) 申请公布日期 2009.11.18
申请号 KR20080044445 申请日期 2008.05.14
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD.;INHA-INDUSTRY PARTNERSHIP INSTITUTE 发明人 O, BEOM HOAN;LEE, WOOK HEE;LEE, MIN WOO;YIM, HAE DONG;JI, WON SOO
分类号 G01B11/25;G01B11/00;G01B11/24 主分类号 G01B11/25
代理机构 代理人
主权项
地址