发明名称 Electrostatic discharge protection device
摘要 An electrostatic discharge (ESD) protection device is disclosed including at least an NPN transistor and a PNP transistor coupled between a first node and a second node, wherein the ESD protection device may be configured to sink current from the first node to the second node in response to an ESD event. The transistors may be coupled such that a collector of the NPN may be coupled to the first node. A collector of the PNP may be coupled to the second node. A base of the NPN may be coupled to the emitter of the PNP. An emitter of the NPN may be coupled to a base of the PNP.
申请公布号 US9349716(B2) 申请公布日期 2016.05.24
申请号 US201313760367 申请日期 2013.02.06
申请人 Sofics BVBA 发明人 Sorgeloos Bart;Van Camp Benjamin;Van Wijmeersch Sven;Vanhouteghem Wim
分类号 H01L27/02;H01L23/60;H01L29/87 主分类号 H01L27/02
代理机构 Volpe and Koenig, P.C. 代理人 Volpe and Koenig, P.C.
主权项 1. An electrostatic discharge (ESD) protection device coupled between a first node and a second node, the ESD protection device comprising: a first lowly doped region of a P dopant type; a second lowly doped region of a N dopant type within the first lowly doped region; a third region including a first highly doped region of the N dopant type, wherein the third region is formed directly within the first lowly doped region, the first highly doped region is coupled to the first node, and no highly doped region of the P dopant type is formed within the third region; and a fourth region including a second highly doped region of the P dopant type, wherein the fourth region is formed directly within the second lowly doped region, the second highly doped region is coupled to the second node, and no highly doped region of the N dopant type is formed within the fourth region; wherein a voltage at the first highly doped region is higher than a voltage at the second highly doped region, and further wherein a junction between the first highly doped region and the first lowly doped region is configured to enter into reverse breakdown in response to an ESD event, and a junction between the second lowly doped region and the second highly doped region is configured to enter into a reverse breakdown in response to the ESD event, such that the ESD protection device is configured to sink current from the first node to the second node in response to an ESD event.
地址 Gistel BE