发明名称 High-accuracy pattern shape evaluating method and apparatus
摘要 A quantity (or dispersion value) of a distribution of edge position due to random noise is expected to be reduced statistically to 1/N when N edge position data items are averaged. Using this property, the single page image is averaged in a vertical direction with various values of parameter S, and then the edge roughness index is calculated. The S-dependence of the edge roughness index is analyzed and a term of a dispersion value directly proportional to 1/S is determined as being due to noise.
申请公布号 US7619751(B2) 申请公布日期 2009.11.17
申请号 US20080125444 申请日期 2008.05.22
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 YAMAGUCHI ATSUKO;FUKUDA HIROSHI;KOMURO OSAMU;KAWADA HIROKI
分类号 G01B11/24;G01N23/00;G06K9/46 主分类号 G01B11/24
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