发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME |
摘要 |
A semiconductor device is provided as follows. Active fins protrude from a substrate, extending in a first direction. A first device isolation layer is disposed at a first side of the active fins. A second device isolation layer is disposed at a second side of the active fins. A top surface of the second device isolation layer is higher than a top surface of the first device isolation layer and the second side is opposite to the first side. A normal gate extends across the active fins in a second direction crossing the first direction. A first dummy gate extends across the active fins and the first device isolation layer in the second direction. A second dummy gate extends across the second device isolation layer in the second direction. |
申请公布号 |
US2016163699(A1) |
申请公布日期 |
2016.06.09 |
申请号 |
US201514824896 |
申请日期 |
2015.08.12 |
申请人 |
You Jung-Gun;Lee Jeong-Hyo |
发明人 |
You Jung-Gun;Lee Jeong-Hyo |
分类号 |
H01L27/088;H01L29/49;H01L29/06 |
主分类号 |
H01L27/088 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a plurality of active fins protruding from a substrate and extending in a first direction; a first device isolation layer disposed at a first side of the active fins; a second device isolation layer disposed at a second side of the active fins, wherein a top surface of the second device isolation layer is higher than a top surface of the first device isolation layer and the second side is opposite to the first side; a normal gate extending across the active fins in a second direction crossing the first direction; a first dummy gate extending across the active fins and the first device isolation layer in the second direction; and a second dummy gate extending across the second device isolation layer in the second direction. |
地址 |
Ansan-si KR |