| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a wavelength dispersion type X-ray spectrometer that performs detailed and precise analysis in a short time and has small individual difference. <P>SOLUTION: A signal output from an X-ray detector 10 by dispersion of X-rays released from a sample S and introduction of it into the X-ray detector 10 is input into an A/D converter 30 through a preamplifier 14, sampled and digitized with a predetermined sampling period, and then input into a digital processing circuit 32. The digital processing circuit 32 discriminates the input digital signals according to its wave height value, then counts them independently, and creates wave height distribution data. <P>COPYRIGHT: (C)2010,JPO&INPIT</p> |
