| 摘要 |
PURPOSE: A semiconductor memory device without current consumption in a memory device is provided to progress a parallel test and reduce current consumption by using a first parallel test mode. CONSTITUTION: A semiconductor memory device without current consumption in a memory device includes a first parallel test mode signal generating unit, and a second parallel test mode signal generating unit. The first parallel test mode signal generating unit leads data from the bank and operates the bank. The first parallel test mode signal generating unit is enabled in the first parallel test mode. The second parallel test mode signal generating unit leads data from the banks. |
