发明名称 DIGITAL MODULATED SIGNAL TEST EQUIPMENT AND TEST METHOD
摘要 <p>An amplitude expected value data generating portion (76) generates amplitude expected value data (EP) indicating which amplitude segment the amplitude at each sampling point on a modulated signal waveform which corresponds to the expected value of the data (St) received from a test device belongs to. A demodulator (60) samples the test signal waveform (St) received from the test device, and generates judgment data (DD) which indicates which amplitude segment the amplitude at each sampling point belongs to. A judgment portion (78) compares the amplitude expected value data (EP) and the judgment data (DD) for each sampling point.</p>
申请公布号 WO2009136428(A1) 申请公布日期 2009.11.12
申请号 WO2008JP01180 申请日期 2008.05.09
申请人 ADVANTEST CORPORATION;WATANABE, DAISUKE;OKAYASU, TOSHIYUKI 发明人 WATANABE, DAISUKE;OKAYASU, TOSHIYUKI
分类号 H04L27/00;G01R29/06;G01R31/319 主分类号 H04L27/00
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