发明名称 |
TEST PROGRAM INSPECTION APPARATUS AND METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a test program inspection apparatus and method that easily grasps the relationship between a specific event and a test program. <P>SOLUTION: When the occurrence of spike voltage is detected by an event detection means 12, an execution position detection means 21 detects a position on a test program being executed by a test execution means 11. A display means 23 displays the contents of the test program on the position detected by the execution position detection means 21. An edit means 24 receives the edits of the contents of the test program displayed by the display means 23. <P>COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2009264782(A) |
申请公布日期 |
2009.11.12 |
申请号 |
JP20080111416 |
申请日期 |
2008.04.22 |
申请人 |
YOKOGAWA ELECTRIC CORP |
发明人 |
TAKASHIMA ATSUSHI;ETO TOMOAKI;KAMEKO AKIHIKO;KAWAMURA AKIHISA |
分类号 |
G01R31/28;G06F11/22;G06F11/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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