发明名称 TEST PROGRAM INSPECTION APPARATUS AND METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a test program inspection apparatus and method that easily grasps the relationship between a specific event and a test program. <P>SOLUTION: When the occurrence of spike voltage is detected by an event detection means 12, an execution position detection means 21 detects a position on a test program being executed by a test execution means 11. A display means 23 displays the contents of the test program on the position detected by the execution position detection means 21. An edit means 24 receives the edits of the contents of the test program displayed by the display means 23. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009264782(A) 申请公布日期 2009.11.12
申请号 JP20080111416 申请日期 2008.04.22
申请人 YOKOGAWA ELECTRIC CORP 发明人 TAKASHIMA ATSUSHI;ETO TOMOAKI;KAMEKO AKIHIKO;KAWAMURA AKIHISA
分类号 G01R31/28;G06F11/22;G06F11/28 主分类号 G01R31/28
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