发明名称 SEMICONDUCTOR DEVICE WITH METAL GATE AND HIGH-K DIELECTRIC LAYER, CMOS INTEGRATED CIRCUIT, AND METHOD FOR FABRICATING THE SAME
摘要 A semiconductor device includes a gate dielectric layer over a substrate, a metal layer over the gate dielectric layer, a capping layer over the metal layer, wherein the capping layer includes a plurality of dipole forming elements concentrated at the interface between the metal layer and the capping layer.
申请公布号 US2016211183(A1) 申请公布日期 2016.07.21
申请号 US201615085682 申请日期 2016.03.30
申请人 SK hynix Inc. 发明人 JI Yun-Hyuck;KIM Beom-Yong;LEE Seung-Mi
分类号 H01L21/8238;H01L29/51;H01L21/02;H01L21/28 主分类号 H01L21/8238
代理机构 代理人
主权项
地址 Gyeonggi-do KR