发明名称 |
SEMICONDUCTOR DEVICE WITH METAL GATE AND HIGH-K DIELECTRIC LAYER, CMOS INTEGRATED CIRCUIT, AND METHOD FOR FABRICATING THE SAME |
摘要 |
A semiconductor device includes a gate dielectric layer over a substrate, a metal layer over the gate dielectric layer, a capping layer over the metal layer, wherein the capping layer includes a plurality of dipole forming elements concentrated at the interface between the metal layer and the capping layer. |
申请公布号 |
US2016211183(A1) |
申请公布日期 |
2016.07.21 |
申请号 |
US201615085682 |
申请日期 |
2016.03.30 |
申请人 |
SK hynix Inc. |
发明人 |
JI Yun-Hyuck;KIM Beom-Yong;LEE Seung-Mi |
分类号 |
H01L21/8238;H01L29/51;H01L21/02;H01L21/28 |
主分类号 |
H01L21/8238 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
Gyeonggi-do KR |