发明名称 MEASUREMENT APPARATUS AND EXPOSURE APPARATUS
摘要 A measurement apparatus which measures spatial coherence in an illuminated plane illuminated by an illumination system, comprises a measurement mask which has at least three pinholes and is arranged on the illuminated plane, a detector configured to detect an interference pattern formed by lights from the at least three pinholes, and a calculator configured to calculate the spatial coherence in the illuminated plane based on a Fourier spectrum obtained by Fourier-transforming the interference pattern detected by the detector.
申请公布号 US2009279065(A1) 申请公布日期 2009.11.12
申请号 US20090463590 申请日期 2009.05.11
申请人 CANON KABUSHIKI KAISHA 发明人 FURUKAWA YASUNORI
分类号 G03B27/72;G01B9/02;G06F15/00 主分类号 G03B27/72
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