发明名称 Monitoring a Discharge in a Plasma Process
摘要 Devices and methods for monitoring a discharge in a plasma process are provided. An example method includes detecting at least a first signal path of at least one plasma supply signal within at least a first time range within at least one period of the plasma supply signal, detecting at least a second signal path of the at least one plasma supply signal within at least a second time range which is at the point corresponding to the first time range in at least one other period of the plasma supply signal, and generating an identification signal if the second signal path deviates by at least a distance from the first signal path. The distance has a minimum time difference and a minimum signal amplitude difference. The method enables to identify arcs in a very reliable and very rapid manner.
申请公布号 US2016217975(A1) 申请公布日期 2016.07.28
申请号 US201615088629 申请日期 2016.04.01
申请人 TRUMPF Huettinger GmbH + Co. KG 发明人 Leypold Daniel;Richter Ulrich;Wunn Fabian
分类号 H01J37/32;G01R31/12;G01R19/00 主分类号 H01J37/32
代理机构 代理人
主权项 1. A plasma discharge monitor comprising: a signal detector responsive to at least a first signal path of at least one plasma supply signal within at least a first time range within at least one period of the plasma supply signal, andat least a second signal path of at least one plasma supply signal within at least a second time range located at one or more points corresponding to the first time range in at least one other period of the plasma supply signal; and an identification signal generator configured to generate an identification signal if the second signal path deviates by at least a distance from the first signal path, wherein the distance has a minimum time difference and a minimum signal amplitude difference.
地址 Freiburg DE