| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit capable of reducing the number of input/output terminals which are used for a manufacturing test. <P>SOLUTION: The semiconductor integrated circuit is equipped with: a plurality of input terminals to which the data are input; an internal circuit for performing a desired process; a clock terminal to which the clock signal is input; and an input signal control block arranged between the plurality of input terminals and the internal circuit, of which, in a normal operation mode, the data are input respectively from the input terminals and output to the internal circuit, and in a test operation mode, the time division multiplexed data having X(X≥2) of the number of time division being input from a part of the plurality of input terminals are separated based on the clock signal and output to the internal circuit. <P>COPYRIGHT: (C)2010,JPO&INPIT</p> |
