发明名称 |
MEASURING APPARATUS AND METHOD |
摘要 |
PURPOSE: A measuring device and a method thereof are provided to measure the shape of an electronic product accurately by employing the upper surface of a workpiece as a first measurement surface. CONSTITUTION: A measuring device(110) comprises a measuring device(130) and a scanning device(120). The measuring device comprises one or more carrier units to find a workpiece(102). The carrier unit comprises a carrying cell and two data legs. The conveying surface of the carrier unit is contacted with the bottom surface of the workpiece. The two sides of the carrier unit are physically connected with the conveying surface. The carrier unit comprises a data plane expanded from the carrying cell to outside. The scanning device scans the 3 points of upper surfaces of the workpiece and the data leg. The canning device is moved by the driving device.
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申请公布号 |
KR20090117575(A) |
申请公布日期 |
2009.11.12 |
申请号 |
KR20080078902 |
申请日期 |
2008.08.12 |
申请人 |
ORIENT SEMICONDUCTOR ELECTRONICS LIMITED |
发明人 |
LEU JIAN DE;CHANG CHIA CHI;CHENG I CHI;LIU KUN HUA;SU CHEN PING |
分类号 |
G01B11/00;G01B11/02;G01B11/06 |
主分类号 |
G01B11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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