发明名称 PLASMA ETCHING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a plasma etching method in which a stable etching rate is obtained. SOLUTION: In the plasma etching method, a substrate W having a mask pattern formed on a surface is etched in a plasma chamber wherein a target material 30 for sputtering is installed, and plasma of an oxygen-based gas is generated in the plasma chamber in or after the etching of the substrate to ash a surface of a target material 30. The process of ashing the surface of the target material is to remove various reaction products generated in the plasma chamber and sticking on the surface of the target material. The process of ashing is carried out in or after the etching to prevent the etching rate from decreasing owing to sputtering of the reaction products deposited on the surface of the target material, thereby obtaining the stable etching rate. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009267250(A) 申请公布日期 2009.11.12
申请号 JP20080117585 申请日期 2008.04.28
申请人 ULVAC JAPAN LTD 发明人 MORIKAWA YASUHIRO;SU KOKOU;MURAYAMA TAKAHIDE
分类号 H01L21/3065;H01L21/304 主分类号 H01L21/3065
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