发明名称 THERMAL INFRARED DETECTION ELEMENT
摘要 <P>PROBLEM TO BE SOLVED: To provide a highly sensitive thermal infrared detection element that can suppress a negative feedback effect due to a wiring resistance. Ž<P>SOLUTION: In this thermal infrared detection element, a voltage setting circuit (1102) for setting a voltage applied to both ends of an infrared detection diode (101) is serially connected to the diode (101). A dummy diode array (A2) including dummy diodes each not having an infrared absorption structure and/or a heat insulation structure is provided independent from a pixel array (A1). The voltage setting circuit (1102) controls a cathode voltage of the diode (101) so as to make it to be a voltage obtained by subtracting a drop voltage generated by a wiring resistance, a signal line resistance and a drive line resistance and a diode current "If" from a predetermined bias voltage. Degradation of sensitivity by a negative feedback effect due to a wiring resistance of the pixel array (A1) is canceled by the dummy diode array. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009265000(A) 申请公布日期 2009.11.12
申请号 JP20080116833 申请日期 2008.04.28
申请人 MITSUBISHI ELECTRIC CORP 发明人 ONAKADO TAKAHIRO;UENO MASAFUMI
分类号 G01J1/02;G01J1/42;G01J1/44;G01J5/48 主分类号 G01J1/02
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