发明名称 ELECTRIC RESISTANCE MEASURING INSTRUMENT OF NANOPARTICLE AND THAT'S METHOD
摘要 PURPOSE: An apparatus and a method for measuring nano particle DC resistance are provided to measure resistance and conductivity of a sample to be measured by steadily maintaining a contact dimension and pressure applied to the sample. CONSTITUTION: A DC power supply terminal and a current measuring terminal are installed in a main member(10). A plurality of contact terminals in which the current measuring terminal and the DC power supply terminals are electrically connected is installed in a pressurizing member(20). A sample for measuring resistance and conductivity is loaded in a loading groove. A supporting member(30) is coupled with the main member. A coupling unit(40) controls pressure in which the supporting member and the pressurizing member pressurize the sample. A power supply unit(50) is connected to the DC power supply terminal, and supplies a power.
申请公布号 KR20090117551(A) 申请公布日期 2009.11.12
申请号 KR20080043655 申请日期 2008.05.09
申请人 NTSEE CO., LTD. 发明人 RYOO, MIN WOONG;KIM, KWON TACK;YOU, HYOUNG WOO;PARK, HONG CHAE
分类号 G01R27/00;G01R27/08 主分类号 G01R27/00
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