发明名称 |
ELECTRIC RESISTANCE MEASURING INSTRUMENT OF NANOPARTICLE AND THAT'S METHOD |
摘要 |
PURPOSE: An apparatus and a method for measuring nano particle DC resistance are provided to measure resistance and conductivity of a sample to be measured by steadily maintaining a contact dimension and pressure applied to the sample. CONSTITUTION: A DC power supply terminal and a current measuring terminal are installed in a main member(10). A plurality of contact terminals in which the current measuring terminal and the DC power supply terminals are electrically connected is installed in a pressurizing member(20). A sample for measuring resistance and conductivity is loaded in a loading groove. A supporting member(30) is coupled with the main member. A coupling unit(40) controls pressure in which the supporting member and the pressurizing member pressurize the sample. A power supply unit(50) is connected to the DC power supply terminal, and supplies a power. |
申请公布号 |
KR20090117551(A) |
申请公布日期 |
2009.11.12 |
申请号 |
KR20080043655 |
申请日期 |
2008.05.09 |
申请人 |
NTSEE CO., LTD. |
发明人 |
RYOO, MIN WOONG;KIM, KWON TACK;YOU, HYOUNG WOO;PARK, HONG CHAE |
分类号 |
G01R27/00;G01R27/08 |
主分类号 |
G01R27/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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