发明名称 COAXIAL MICROWAVE ASSISTED DEPOSITION AND ETCH SYSTEMS
摘要 Disclosed are systems for achieving improved film properties by introducing additional processing parameters, such as a movable position for the microwave source and pulsing power to the microwave source, and extending the operational ranges and processing windows with the assistance of the microwave source. A coaxial microwave antenna is used for radiating microwaves to assist in physical vapor deposition (PVD) or chemical vapor deposition (CVD) systems. The system may use a coaxial microwave antenna inside a processing chamber, with the antenna being movable between a substrate and a plasma source, such as a sputtering target, a planar capacitively generated plasma source, or an inductively coupled source. In a special case when only a microwave plasma source is present, the position of the microwave antenna is movable relative to a substrate. The coaxial microwave antenna adjacent to the plasma source can assist the ionization more homogeneously and allow substantially uniform deposition over large areas.
申请公布号 WO2009117229(A3) 申请公布日期 2009.11.12
申请号 WO2009US35325 申请日期 2009.02.26
申请人 APPLIED MATERIALS, INC.;STOWELL, MICHAEL, W.;KRISHNA, NETY;HOFMANN, RALF;GRIFFITH, JOE 发明人 STOWELL, MICHAEL, W.;KRISHNA, NETY;HOFMANN, RALF;GRIFFITH, JOE
分类号 C23C16/511;C23C14/22;H01L21/203;H01L21/205;H01L21/302 主分类号 C23C16/511
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