发明名称 |
METHOD AND APPARATUS FOR TESTING A SUBSTRATE FOR DISPLAY DEVICE |
摘要 |
Disclosed is a test method an apparatus in which an area for test and an area for analysis are specified based on the design information of the display device having a non-rectangular display area. To carry out testing, parasitic capacitances are found using the design information, and operations for weighting are performed on test data or threshold values based on which a decision on pass/fail is to be made (FIG. 4).
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申请公布号 |
US2009281754(A1) |
申请公布日期 |
2009.11.12 |
申请号 |
US20090437996 |
申请日期 |
2009.05.08 |
申请人 |
NEC LCD TECHNOLOGIES, LTD. |
发明人 |
TAKATORI KENICHI |
分类号 |
G06F19/00;G01N37/00;G01R31/00;G02F1/13;G02F1/1343;G09F9/00 |
主分类号 |
G06F19/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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