发明名称 METHOD AND APPARATUS FOR TESTING A SUBSTRATE FOR DISPLAY DEVICE
摘要 Disclosed is a test method an apparatus in which an area for test and an area for analysis are specified based on the design information of the display device having a non-rectangular display area. To carry out testing, parasitic capacitances are found using the design information, and operations for weighting are performed on test data or threshold values based on which a decision on pass/fail is to be made (FIG. 4).
申请公布号 US2009281754(A1) 申请公布日期 2009.11.12
申请号 US20090437996 申请日期 2009.05.08
申请人 NEC LCD TECHNOLOGIES, LTD. 发明人 TAKATORI KENICHI
分类号 G06F19/00;G01N37/00;G01R31/00;G02F1/13;G02F1/1343;G09F9/00 主分类号 G06F19/00
代理机构 代理人
主权项
地址