| 摘要 |
A system and a method for photovoltaic thin film quality control. The system illuminates an area of photovoltaic film, acquires the illuminated area and compares it with a predetermined i A system and a method for photovoltaic thin film quality control. The system illuminates an area of photovoltaic film, acquires the illuminated area and compares it with a predetermined image. The difference between the images indicates on presence of photovoltaic thin film defects.
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