发明名称 IMMERSION LITHOGRAPHIC APPARATUS, DRYING DEVICE, IMMERSION METROLOGY APPARATUS AND DEVICE MENUFACTURING METHOD
摘要 <p>PURPOSE: An immersion lithography apparatus, a drying device, an immersion metrology apparatus, and a method for manufacturing a device are provided to remove the liquid from a surface of a substrate and stabilize the meniscus. CONSTITUTION: A lithography apparatus includes a substrate table and a liquid handling structure(12). The substrate table(WT) maintains a substrate(W). The liquid handling structure is arranged to remove the liquid from the substrate table, the substrate on the substrate table, or the surface of the substrate table and the substrate. The liquid handing structure has an array of the liquid extracting openings arrange along the line. Each liquid extracting opening is elongated to each extension direction. The extension direction makes a larger angle than 0 with the line.</p>
申请公布号 KR20090117664(A) 申请公布日期 2009.11.12
申请号 KR20090040484 申请日期 2009.05.08
申请人 ASML NETHERLANDS B.V. 发明人 RIEPEN MICHEL;KEMPER NICOLAAS RUDOLF;VERMEULEN JOHANNES PETRUS MARTINUS BERNARDUS;DIRECKS DANIEL JOZEF MARIA;PHILIPS DANNY MARIA HUBERTUS;VAN PUTTEN ARNOLD JAN
分类号 H01L21/027 主分类号 H01L21/027
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