发明名称 |
SEMICONDUCTOR DEVICE AND CURRENT CONTROL METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
According to one embodiment, a semiconductor device comprises an integrated circuit having a plurality of current modes different in operation current; a voltage sensor that detects a voltage in use by the integrated circuit; a BIST control circuit that generates BIST patterns different in the operation current and creates a flag indicating the success or failure of a BIST corresponding to the operation current based on the result of detecting the voltage while the integrated circuit is made to operate based on the BIST pattern; and a storing unit that stores the flag. The integrated circuit sets the current mode based on the flag. |
申请公布号 |
US2016266199(A1) |
申请公布日期 |
2016.09.15 |
申请号 |
US201514848894 |
申请日期 |
2015.09.09 |
申请人 |
Kabushiki Kaisha Toshiba |
发明人 |
KUROSAWA Yasuhiko |
分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
an integrated circuit having a plurality of current modes different in operation current; a voltage sensor that detects a voltage in use by the integrated circuit; a built-in self test (BIST) control circuit that generates BIST patterns different in the operation current and creates a flag indicating the success or failure of a BIST corresponding to the operation current based on the result of detecting the voltage while the integrated circuit operates based on the BIST pattern; and a storing circuit that stores the flag, wherein the integrated circuit sets the current mode based on the flag. |
地址 |
Minato-ku JP |