发明名称 |
A METHOD FOR MEASURING DIFFRACTION PATTERNS FROM A TRANSMISSION ELECTRON MICROSCOPY TO DETERMINE CRYSTAL STRUCTURES AND A DEVICE THEREFOR |
摘要 |
A device and method which enable a transmission electron microscope to measure electron diffraction patterns of a sample very precisely are disclosed. The patterns are suitable for structure determination. The electron beam is precessed by means of deflector coils (6) in the transmission electron microscope before the sample (4), in combination with a similar precession of the electron diffraction pattern by means of deflector coils (9) situated after the sample. The electron diffraction pattern is scanned by means of deflector coils (9) situated after the sample. |
申请公布号 |
EP1665321(B1) |
申请公布日期 |
2009.11.11 |
申请号 |
EP20030750478 |
申请日期 |
2003.09.02 |
申请人 |
NANOMEGAS SPRL |
发明人 |
SERGEEVICH, AVILOV ANATOLY;VLADIMIROVICH, KULIGIN KIRILL;NICOLOPOULOS, STAVROS |
分类号 |
H01J37/295;G01N23/20 |
主分类号 |
H01J37/295 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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