发明名称 SPECTRAL MEASURING SYSTEM
摘要 A spectral measuring system for determining substance properties using terahertz radiation comprises: one or more radiation sources of which at least one radiation source is adjustable or configurable with regard to its wavelength, wherein the first radiation source emits first radiation at a predetermined first wavelength; and is characterised by a sensor which responds to further radiation which is based on the radiation of the at least one radiation source; a control unit which is connected to the at least one radiation source and the sensor; wherein the control unit is configured to trigger at least one radiation source and to adjust the wavelength of the at least one adjustable radiation source as well as to read out the sensor.
申请公布号 EP2115407(A2) 申请公布日期 2009.11.11
申请号 EP20080708289 申请日期 2008.01.28
申请人 MSA AUER GMBH 发明人 BOEGLI, URS;BACHMANN, PHILIPP;LUBKOLL, DIETER
分类号 G01J3/42;G01N21/35 主分类号 G01J3/42
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