<p>A system for on-the-fly inspection of components is provided. The system includes a prism structure disposed below an inspection item transit path. An image data system is disposed below the prism structure. A lighting assembly provides a first lighting source to illuminate a plurality of sides of an inspection item and a second lighting source to illuminate a bottom of the inspection item.</p>
申请公布号
EP2116840(A2)
申请公布日期
2009.11.11
申请号
EP20090159507
申请日期
2009.05.06
申请人
SEMICONDUCTOR TECHNOLOGIES & INSTRUMENTS PTE LTD.
发明人
AMANULLAH, AJHARALI;GE, HAN CHENG;TAN, HUEK CHOY;LAI, HING TIM