发明名称 Multiple surface inspection system and method
摘要 <p>A system for on-the-fly inspection of components is provided. The system includes a prism structure disposed below an inspection item transit path. An image data system is disposed below the prism structure. A lighting assembly provides a first lighting source to illuminate a plurality of sides of an inspection item and a second lighting source to illuminate a bottom of the inspection item.</p>
申请公布号 EP2116840(A2) 申请公布日期 2009.11.11
申请号 EP20090159507 申请日期 2009.05.06
申请人 SEMICONDUCTOR TECHNOLOGIES & INSTRUMENTS PTE LTD. 发明人 AMANULLAH, AJHARALI;GE, HAN CHENG;TAN, HUEK CHOY;LAI, HING TIM
分类号 G01N21/88 主分类号 G01N21/88
代理机构 代理人
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