METHOD FOR COMPENSATING DEFOCUS OF WAFER LEVEL CAMERA MODULE

摘要

PURPOSE: A method for correcting defocus of a wafer level camera module is provided to improve yield of the wafer level camera module by selective injecting and adhering a spacer wafer with the height considering the deflection of BFL(Back Focal Length). CONSTITUTION: A BFL value of a lens wafer is obtained by measuring a BFL value of a unit lens(L) comprising a lens wafer(10). A spacer wafer(20) with the height compensating for the defocus by corresponding to the BFL value of the lens wafer is prepared. The spacer wafer is inserted and adhered between a lens wafer and a sensor wafer(30). The laminated wafers are diced and separated to unit camera module. The average value or central value of the BFL values of the measured unit lens is used as the BFL value of the lens wafer. A light receiving unit(40) and a transparent material(50) sealing the light receiving unit are equipped in the upper side of the sensor wafer.