发明名称 Electrostatic discharge protection circuit and electrostatic discharge protection method of a semiconductor memory device
摘要 An electrostatic discharge (ESD) protection circuit protects a gate oxide of elements in an internal circuit against ESD. During an ESD test, if the sum of driving voltages of ESD protectors connected between a power pad and a ground pad is higher than the gate oxide breakdown voltage of elements in the internal circuit, the structure of the ESD protector is changed or another ESD protector is additionally provided so as to protect the gate oxide of the elements in the internal circuit against ESD.
申请公布号 US7616415(B2) 申请公布日期 2009.11.10
申请号 US20070735038 申请日期 2007.04.13
申请人 HYNIX SEMICONDUCTOR INC. 发明人 MOON JUNG EON;KANG DAE GWAN;KWAK KOOK WHEE;CHOI NAK HEON;LEE SI WOO;SON HEE JEONG;YUN SUK;JEONG SEONG HOON;LEE JOON WON
分类号 H02H9/00 主分类号 H02H9/00
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