发明名称 PROCESS FOR FORMING COBALT AND COBALT SILICIDE MATERIALS IN COPPER CONTACT APPLICATIONS
摘要 Embodiments of the invention provide methods for forming cobalt silicide layers and metallic cobalt layers by using various deposition processes and annealing processes. In one embodiment, a method for forming a cobalt silicide material on a substrate is provided which includes treating the substrate with at least one preclean process to expose a silicon-containing surface, depositing a cobalt silicide material on the silicon-containing surface, and depositing a copper material on or over the cobalt silicide material. In another embodiment, a metallic cobalt material may be deposited on the cobalt silicide material prior to depositing the copper material. In one example, the copper material may be formed by depositing a copper seed layer and a copper bulk layer on the substrate. The copper seed layer may be deposited by a PVD process and the copper bulk layer may be deposited by an ECP process or an electroless deposition process.
申请公布号 WO2009134925(A2) 申请公布日期 2009.11.05
申请号 WO2009US42165 申请日期 2009.04.29
申请人 APPLIED MATERIALS, INC.;YU, SANG-HO;MORAES, KEVIN;GANGULI, SESHADRI;CHUNG, HUA;PHAN, SEE-ENG;KHANDELWAL, AMIT;WU, KAI 发明人 YU, SANG-HO;MORAES, KEVIN;GANGULI, SESHADRI;CHUNG, HUA;PHAN, SEE-ENG;KHANDELWAL, AMIT;WU, KAI
分类号 H01L21/205;H01L21/336 主分类号 H01L21/205
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