发明名称 QUALITY MANAGEMENT SYSTEM USING MARK
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a quality management system for a photoelectric conversion device that allows easy and integrated execution of management of a manufacturing process of a photoelectric conversion device and management of inspection results by a simple and inexpensive device. <P>SOLUTION: The quality management system is provided with a means for attaching a first mark, having resistance against the subsequent steps, on the surface of a translucent substrate, a means for managing the subsequent steps by the first mark attached on the translucent substrate, a means for attaching a second mark excellent in visibility on the translucent substrate, and a means for managing the subsequent steps by the second mark attached on the translucent substrate, in a photoelectric-conversion-device manufacturing process. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2009260399(A) 申请公布日期 2009.11.05
申请号 JP20090185635 申请日期 2009.08.10
申请人 KANEKA CORP 发明人 SAWAI KAZUNORI;HIRAISHI MASASHI
分类号 H01L31/04 主分类号 H01L31/04
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