| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a built-in self test controller and a programmable method by which the selection and modification of an algorithm applied to a related memory to be tested are attainable. Ž<P>SOLUTION: The method of the programmable memory built-in self test (MBIST), the apparatus, and a system are disclosed. An exemplary embodiment of the disclosed technology can be used, e.g. to test one or multiple memories located on an integrated circuit during the manufacturing test. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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