| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a semiconductor X-ray detecting element, capable of improving the reliability and the yield. <P>SOLUTION: An n-surface electrode (3) is formed on a central part of one bottom surface of a substantially columnar-shaped semiconductor, having an i-layer(1) and a p-layer (5) surrounding the i-layer (1), and a p-surface electrode (7) is formed on the other bottom surface; the bottom surface from the periphery of the n-surface electrode (3) to the circumferential surface of the semiconductor is a tapered surface (8), lowering from the periphery of the n-surface electrode (3) to the circumferential surface of the semiconductor; even if the i-layer (1) spreads to the circumferential surface of the semiconductor to cause an i-layer exposed region at drifting, the i-layer exposed region is removed, because the tapered surface (8) is formed, so as to enable securing a structure with the entire circumferential surface of the i-layer (1) being embraced into a columnar shape by the p-layer (5). <P>COPYRIGHT: (C)2010,JPO&INPIT</p> |
