发明名称 ATOMIC FORCE MICROSCOPE AS AN ANALYZING TOOL FOR BIOCHIP
摘要 The present application discloses a method for detecting a presence of target ligand in a fluid medium which includes the steps of: (i) contacting the fluid medium with a solid substrate that includes an array of dendrons on its surface, wherein each of the dendron includes a central atom, a probe that is attached to the central atom optionally through a linker, and a base portion attached to the central atom and having a plurality of termini that are attached to the surface of the solid support; and (ii) determining the presence of a probe-target ligand complex by measuring binding force between the bound ligand and detection molecule tethered to the tip of an atomic force microscope ('AFM'), which detection molecule has affinity for the ligand, wherein measurement of an increase in force between the probe-target ligand complex and the detection molecule by AFM indicates the presence of the probe-target ligand complex.
申请公布号 WO2009109809(A3) 申请公布日期 2009.11.05
申请号 WO2008IB03959 申请日期 2008.06.16
申请人 POSTECH ACADEMY-INDUSTRY FOUNDATION;POSCO;PARK, JOON WON;HONG, BONG JIN;KWON, SUNG HONG 发明人 PARK, JOON WON;HONG, BONG JIN;KWON, SUNG HONG
分类号 C12Q1/68;G01N33/48 主分类号 C12Q1/68
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